Method for detecting non-valid states in film processor temperat

Details Method for detecting non-valid states in film processor temperat Method for detecting non-valid states in film processor temperat

1991-09-13

1993-09-14

Mathews, A. A.

354322, 34 31, 34 48, G03D 300

Patent

active

052453774

ABSTRACT:
A temperature control system (10) of an automatic film processor (12) includes developer and fixer recirculation paths (30, 40) having thermowell heaters (34, 44) and thermistors (35, 45), and a cooling loop (37) in the developer path (30) which passes in heat exchange relationship with water in a wash tank (23). The system (10) also has a blower (48), heater (49) and thermistor (52) in an air path of a dryer (24). Actual heating and cooling rates of heating and cooling cycles are determined based on temperature measurements by the thermistors (35, 45, 52). Heater (34, 44, 49) and cooling loop (37) operation is controlled by comparing measured temperatures with preestablished setpoint temperatures. Malfunctions of system (10) are identified by comparing actual rates with rates characteristic of normal operations. Measured temperature data is validated based on comparing measured temperature with temperature predictions calculated based on heat gain or loss relationships associated with particular heating or cooling cycles. Randomly occurring invalid data is disregarded for control and error diagnosis purposes.

REFERENCES:
patent: 4057817 (1977-11-01), Korb et al.
patent: 4160153 (1979-07-01), Melander
patent: 4182567 (1980-01-01), Laar et al.
patent: 4300828 (1981-11-01), Kaufmann
patent: 4316663 (1982-02-01), Fischer
patent: 4332456 (1982-06-01), Kaufmann
patent: 4914835 (1990-04-01), Kose et al.
patent: 4952960 (1990-08-01), Kosugi et al.
patent: 4985720 (1991-01-01), Masuda et al.
patent: 4994837 (1981-02-01), Samuels et al.
patent: 5065173 (1991-11-01), Samuels et al.
Kenneth W. Oemcke, "Ambient Water Thermal Control System," Dept. of Mechanical Engineering, Rochester, N.Y., Jul. 1978.

Affiliated with

Also associated with

Rating

Method for detecting non-valid states in film processor temperat does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for detecting non-valid states in film processor temperat, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for detecting non-valid states in film processor temperat will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2031079