Method for detecting lateral surface charge migration...

Details Method for detecting lateral surface charge migration... Method for detecting lateral surface charge migration...

2007-11-20

2007-11-20

Beatty, Robert (Department: 2852)

Electrophotography

Control of electrophotography process

Of plural processes

C399S159000

Reexamination Certificate

active

11005980

ABSTRACT:
The amount of lateral charge migration (LCM) on a photoreceptor is quantified by measuring the average potential of a latent image formed on the photoreceptor surface. The surface is first uniformly charged, then exposed a first time to an image. After a waiting period during which LCM may occur, the surface is exposed a second time to the image. After another waiting period, the average potential is measured. The amount of LCM may be quantified by varying the waiting periods.

REFERENCES:
patent: 5163075 (1992-11-01), Lubinsky et al.
patent: 6124072 (2000-09-01), Arai et al.
patent: 6223006 (2001-04-01), Scheuer et al.
patent: 6461780 (2002-10-01), Itami et al.
patent: 6516161 (2003-02-01), Asai
patent: 6647219 (2003-11-01), Buettner
patent: 05323741 (1993-12-01), None
patent: 2004037680 (2004-02-01), None

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