Method for detecting faulty elements of a redundancy semiconduct

Details Method for detecting faulty elements of a redundancy semiconduct Method for detecting faulty elements of a redundancy semiconduct

1994-07-26

1998-06-30

Nguyen, Hoa T.

G06F 1120

Patent

active

057746460

ABSTRACT:
A method whereby the N elements of a memory are read sequentially, and the data items contained therein are compared with reference data items. Simultaneously with the reading of each element of the memory, its address is written in a number of redundancy check registers, each connected to a respective redundancy element. In the event the element of the memory differs from the reference data item, the first of the redundancy check registers is blocked to prevent it from being overwritten and the address of a faulty element of the memory is permanently stored. Upon the entire memory being read, the addresses of any faulty elements in the memory are thus already stored in the redundancy check registers.

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