Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-05-02
1998-07-07
Karlsen, Ernest F.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
G01R 3126
Patent
active
057774870
ABSTRACT:
A method for detecting a failure in an electronic device having an electric circuit. The method includes the steps of coating the electric circuit with a liquid crystal having a transition temperature between nematic and isotropic phases. A voltage is applied across the electric circuit so that the temperature of the liquid crystal at the failure approximates the transition temperature of the liquid crystal. The voltage applied is cycled across the electric circuit between a first nonzero voltage which is greater than the transition temperature and a second nonzero voltage which is less than the transition temperature. The cycling of the voltage reduces transient optical effects in the liquid crystal which have an appearance similar to the isotropic phase of the liquid crystal. A tester and liquid crystal for use in the method are provided.
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G.J. West, A Simple Technique for Analysis of ESD Failures of Dynamic Rams Using Liquid Crystals (1982) IEEE/Proc., pp. 185-187. (Month unavailable).
Burgess, et al., Improved Sensitivity for Hot Spot Detection Using Liquid Crystals (1984) IEEE/IRPS, pp. 119-121. (Month unavailable).
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O.D. Trapp, Liquid Crystal Hot Spot Detection Kit 4300 Procedure, Part Number 4304 (Mar. 31, 1988, Revised) pp. 1-18.
John Hiatt; "A Method of Detecting Hot Spots on Semiconductors Using Liquid Crystal"; IEEE/Proc. IRPS; Jun. 1981; pp. 130-133.
Burgess David L.
Trapp Orlin D.
Karlsen Ernest F.
Phung Anh
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