Optics: measuring and testing – By polarized light examination – With birefringent element
Reexamination Certificate
2011-05-31
2011-05-31
Toatley, Gregory J (Department: 2877)
Optics: measuring and testing
By polarized light examination
With birefringent element
Reexamination Certificate
active
07952712
ABSTRACT:
To provide a method for detecting the equatorial plane, capable of detecting directly an equatorial plane that has the optical axis as the axis thereof, in a spherical optically uniaxial crystal. The method for detecting the equatorial plane as set forth in a first form of the present invention is a method for detecting an equatorial plane of a spherical member made from a single crystal of an optically uniaxial crystal having birefringence, comprising: a step for causing light to be incident on the spherical member through a polarizer; and a step for observing the isogyre that is structured by the light that is emitted from the spherical member through an analyzer that has a cross-nicol relationship with the polarizer; wherein the isogyre is an isogyre that is observed when the oscillating direction of the polarizer or the analyzer is near to parallel with the optical axis of the spherical member.
REFERENCES:
patent: 2003-115743 (2003-04-01), None
patent: 2005-291955 (2005-10-01), None
patent: 2008-139051 (2008-06-01), None
patent: 2009085655 (2009-04-01), None
Ebi Yusuke
Segawa Susumu
McDermott Will & Emery LLP
Toatley Gregory J
Valentin Juan D
Yamatake Corp.
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