Optics: measuring and testing – Photometers – Photoelectric
Reexamination Certificate
2011-08-30
2011-08-30
Toatley, Gregory J (Department: 2877)
Optics: measuring and testing
Photometers
Photoelectric
C250S370010, C250S472100, C356S301000, C356S303000, C977S742000, C977S833000
Reexamination Certificate
active
08009284
ABSTRACT:
A method for detecting an electromagnetic wave includes: providing a carbon nanotube structure including a plurality of carbon nanotubes arranged along a same direction. The carbon nanotube structure is irradiated by an electromagnetic wave to be measured. The resistance of the carbon nanotube structure irradiated by the electromagnetic wave is measured.
REFERENCES:
patent: 2008/0067619 (2008-03-01), Farahani et al.
patent: 2009/0279390 (2009-11-01), Jiang et al.
patent: 101275867 (2008-10-01), None
Bolometric infrared photoresponse of suspended single-walled carbon nanotube films, Science, Mikhail E. Itkis et al, vol. 312, p. 412(2006).
Fan Shou-Shan
Jiang Kai-Li
Liu Liang
Xiao Lin
Zhang Yu-Ying
Alli Iyabo S
Altis Law Group, Inc.
Hon Hai Precision Industry Co. Ltd.
Toatley Gregory J
Tsinghua University
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