Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1993-08-19
1998-08-25
Snow, Walter E.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324769, 437 8, H01H 3112, G01R 3126
Patent
active
057986495
ABSTRACT:
The reliability of thin film insulators is determined with noise measurements which find the barrier height mean and standard deviation. A constant voltage source is applied across the thin film insulator. A low noise amplifier is connected across a resistor which is in series with the insulator. A spectrum analyzer is connected to the low noise amplifier. The power density is obtained by observing the output of a spectrum analyzer. The current spectral density is compared to a predetermined reference to detect the presence of defects in the insulator.
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Anselm Klaus A.
Smayling Michael C.
Donaldson Richard L.
Kesterson James C.
Laws Gerald E.
Snow Walter E.
Texas Instruments Incorporated
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