Method for detecting defects in an active matrix liquid crystal

Details Method for detecting defects in an active matrix liquid crystal Method for detecting defects in an active matrix liquid crystal

1996-10-29

1998-10-20

Karlsen, Ernest F.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

345 92, G01R 3100

Patent

active

058251960

ABSTRACT:
Disclosed herein is a method for detecting a defect of an active matrix liquid crystal panel, the method including a step of inputting a data signal for displaying an image having a luminance level lower than a maximum luminance level to a first signal line while inputting a data signal for displaying a black image to a second signal line and a third signal line, the second signal line and the third signal line adjoining the first signal line, thereby causing pixels corresponding to the first signal line to display a single color. According to the method of the present invention, any defective pixel is displayed darker than normal, owing to a decrease in the transmittance, so that point defects such as S-D leak defects can be easily detected.

REFERENCES:
patent: 5113134 (1992-05-01), Plus et al.
patent: 5444390 (1995-08-01), Bartlett et al.
patent: 5546013 (1996-08-01), Ichioka et al.
patent: 5608558 (1997-03-01), Katsumi

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