Method for detecting component defects of an analog signal...

Details Method for detecting component defects of an analog signal... Method for detecting component defects of an analog signal...

2006-06-08

2011-11-01

Phan, Huy Q (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S500000, C324S523000, C714S719000, C714S724000

Reexamination Certificate

active

08049524

ABSTRACT:
A method for detecting component defects of an analog signal processing circuit, especially for a measurement transmitter. A test signal TS is generated at a first test point TP1and an associated response signal RS tapped at a second test point TP2and evaluated in a digital unit. In the evaluation, individual amplitude values of the response signal RS are compared with predetermined, desired values. In the case of significant deviations, a defect report is generated.

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