Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2003-07-18
2009-02-03
Feliciano, Eliseo Ramos (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
C702S180000, C702S182000, C702S188000, C324S716000
Reexamination Certificate
active
07487064
ABSTRACT:
A method that uses a goodness of fit test/measurement (e.g., correction coefficient) for process control of a test parameter (e.g., resistance). At least the minimum number of test values required to calculate a goodness of fit test is obtained. A curve is fitted for the test parameters values and the independent variable(s). A goodness of fit measurement/test (e.g., correlation coefficient) is calculated for the curve and data. The goodness of fit measurement value is used for process control. Control limits can be established on the goodness of fit measurement values. The use of the goodness of fit test is a sensitive test that can used to control processes with low level defects or small fluctuations.
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Chartered Semiconductor Manufacturing Ltd.
Feliciano Eliseo Ramos
Horizon IP Pte Ltd
Huynh Phuong
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