Image analysis – Applications – Manufacturing or product inspection
Patent
1996-12-09
1999-12-14
Kelley, Christopher S.
Image analysis
Applications
Manufacturing or product inspection
348 92, G06K 900
Patent
active
060027908
ABSTRACT:
A method of detecting and measuring voids in insulation material includes: providing a sample of insulation material; providing an imaging system for generating an image of the sample of the insulation material; analyzing the image to detect the presence of voids therein; and measuring the voids present in the sample to determine their size and density. Preferably, a nondestructive imaging system is utilized to detect and measure the voids.
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Avila Steven M.
Horvath David A.
Advent Engineering Services, Inc.
Bradley Gregory L.
Kelley Christopher S.
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