Method for detecting and isolating faults in digital and analog

Details Method for detecting and isolating faults in digital and analog Method for detecting and isolating faults in digital and analog

1974-11-22

1976-11-09

Wise, Edward J.

Registers

Transfer mechanism

Traveling pawl

324 73PC, 250338, 340228R, G01J 510, G01R 3128

Patent

active

039913023

ABSTRACT:
A method for detecting faults in digital and analog circuits including the steps of thermally stabilizing the circuit, applying electrical stimulus to the circuit for a predetermined time period, scanning the circuit to determine the infrared response, applying another desired electrical stimulus to the circuit for a predetermined time period, scanning the circuit to determine the infrared response, repeating the applying and scanning sequence as desired, and comparing the resulting infrared responses with normal infrared profiles to detect and isolate faults in the circuit.

REFERENCES:
patent: 3350702 (1967-10-01), Herman
patent: 3463007 (1969-08-01), Jones et al.
patent: 3868508 (1975-02-01), Lloyd
infrared Microscopy for the Determination of the Initial State of an Integrated Circuit, M. Feuer & P. Goel; IBM Technical Disclosure Bulletin, vol. 15, No. 11, Apr. 1973, p. 3376.
Infrared as a Thermal Analysis Tool; M. L. Rauhe & H. E. Randall, Solid State Technology, Mar. 1970, pp. 67-72 and 87.

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