Method for depositing an n+ amorphous silicon layer onto contami

Coating processes – Electrical product produced – Integrated circuit – printed circuit – or circuit board

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

427402, B05D 306, B05D 136

Patent

active

048428922

ABSTRACT:
A method of depositing a delamination bubble-free PECVD thin film n+ amorphous silicon layer, from the decomposition of a gaseous mixture of silane and phosphine, upon a substrate having one or more thin film layers thereon, wherein there is contamination upon the exposed surface of the outer thin film layer, comprising purging the plasma chamber with pure silane gas, igniting the plasma and then introducing the gaseous mixture of silane and phosphine into the plasma chamber to complete the formation of the n+ layer.

REFERENCES:
patent: 4485125 (1984-11-01), Izu et al.
patent: 4582721 (1986-04-01), Yoshino et al.
patent: 4634601 (1987-01-01), Hamakawa et al.
patent: 4705913 (1987-11-01), Campbell, III
patent: 4743750 (1988-05-01), Komatsu et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for depositing an n+ amorphous silicon layer onto contami does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for depositing an n+ amorphous silicon layer onto contami, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for depositing an n+ amorphous silicon layer onto contami will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-812537

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.