Method for crystallizing silicon

Single-crystal – oriented-crystal – and epitaxy growth processes; – Processes of growth from solid or gel state – Using heat

Reexamination Certificate

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C117S043000, C117S044000, C117S045000, C117S046000, C117S073000, C117S074000, C117S904000, C438S482000, C438S486000, C438S155000, C438S166000, C257S071000, C257S072000

Reexamination Certificate

active

07384476

ABSTRACT:
A method for crystallizing silicon is provided. The method includes: forming an amorphous silicon layer on a substrate; aligning a mask above the substrate, the mask being divided into a plurality of blocks, each block having at least two transmission patterns, the transmission patterns of one block and the transmission patterns of another adjacent block being complimentary with each other and the mask including at least two diffraction patterns disposed between the transmission patterns; forming a first crystallization region on the amorphous silicon layer by irradiating a laser beam through the transmission patterns of the mask; and displacing the substrate or the mask by a predetermined distance and irradiating a laser beam onto the substrate to recrystallize the crystallization region using the laser beam that passes through the diffraction patterns, and forming a second crystallization region using the laser beam that passes through the transmission patterns.

REFERENCES:
patent: 6322625 (2001-11-01), Im
patent: 6800540 (2004-10-01), You
patent: 6908835 (2005-06-01), Sposili et al.
patent: 2002/0179001 (2002-12-01), Jung
patent: 2002/0179004 (2002-12-01), Jung
patent: 2002/0197759 (2002-12-01), Yang
patent: 2003/0088848 (2003-05-01), Crowder
patent: 2004/0053450 (2004-03-01), Sposili et al.
patent: 2005/0040148 (2005-02-01), Jung
patent: 2005/0056623 (2005-03-01), Jung
patent: 2005/0202654 (2005-09-01), Im
patent: 2005/0271952 (2005-12-01), Jung
patent: 2006/0030164 (2006-02-01), Im

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