Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Reexamination Certificate
2006-11-27
2010-12-07
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
By dispersed light spectroscopy
With sample excitation
Reexamination Certificate
active
07847934
ABSTRACT:
The present invention relates to a method for correcting spectral interference in a spectrum which is determined using an inductively coupled plasma spectrometer (ICP) for analysing element contents of a liquid or gaseous sample, comprising the following steps:recording the spectrum of a matrix solution containing all spectrally interfering components, which are also contained in the sample, in a first concentration;recording the spectrum of the matrix solution in at least one dilution of the first concentration;regressing the signal intensities obtained in steps a. and b. against the concentration for a number of wavelength positions;calibrating the spectrometer, background correction using the values determined from the regression in step c. and determining the calibration function c=f(I);recording the sample spectrum using at least one analyte which is contained therein;determining the concentration of the spectrally interfering components in the sample using the results obtained in step c. for wavelength positions at which no line of the analyte of the sample is present; anddetermining the sample signal which is characteristic of the analyte concentration by forming the difference between the spectrum from step e. and the calculated matrix spectrum in a dilution which was calculated in step f., wherein the calibration function c=f(I) is used.
REFERENCES:
patent: 5742525 (1998-04-01), Ye
patent: 6418383 (2002-07-01), Wang
patent: 0415151 (1991-03-01), None
patent: 1004005 (2000-05-01), None
patent: 2291184 (1996-01-01), None
E.H. Van Veen, “Application of mathematical procecures to background correction and multivariate analysis in inductively coupled plasma-optical emission spectrometry”, Spectrochimica Acta, Part B, vol. 53, p. 639-669, 1998.
M. Griffiths et al., “Comparison of traditional and multivariate calibration techniques applied to complex matrices using inductively coupled plasma atomic emission spectroscopy”, Journal of Analytical Atomic Spectrometry, vol. 15, p. 967-972, 2000.
E.H. Vanveen et al., On the use of line intensity ratios and power adjustments to control matrix effects in inductively coupled plasma optical emission spectrometry, Journal of Analytical Atomic Spectrometry, vol. 14, p. 8131-838, 1999.
Chowdhury Tarifur
Connolly Bove & Lodge & Hutz LLP
Nur Abdullahi
Spectro Analytical Instruments GmbH
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