Method for correcting eclipse or darkle

Television – Camera – system and detail – Solid-state image sensor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C348S243000, C348S241000, C250S208100

Reexamination Certificate

active

07573519

ABSTRACT:
A CMOS image sensor includes a plurality of pixels arranged column and rows in an array; a column circuit for storing reset values and a value after integration; a correlated double sampler which derives an image signal from the reset and the value after integration; and an anti-eclipse circuit physically separately from the column circuit and electrically connected to one or shared between multiple columns of pixels for restoring corrupted column voltage on a column of pixels.

REFERENCES:
patent: 4792859 (1988-12-01), Wicker et al.
patent: 6469740 (2002-10-01), Kuroda et al.
patent: 6803958 (2004-10-01), Wang
patent: 6822679 (2004-11-01), Kulhalli et al.
patent: 6844896 (2005-01-01), Henderson et al.
patent: 6873363 (2005-03-01), Barna et al.
patent: 6888572 (2005-05-01), Kozlowski
patent: 7477298 (2009-01-01), Lee et al.
patent: 2004/0012696 (2004-01-01), Teratani et al.
patent: 2004/0075759 (2004-04-01), Sato et al.
patent: 2006/0044414 (2006-03-01), Lee et al.
patent: 2006/0238634 (2006-10-01), Yan

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for correcting eclipse or darkle does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for correcting eclipse or darkle, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for correcting eclipse or darkle will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4139412

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.