Excavating
Patent
1997-10-23
1999-01-19
Chung, Phung M.
Excavating
371 30, G06F 1100
Patent
active
058621440
ABSTRACT:
A method for correcting a high frequency measurement error which can exactly correct the high frequency measurement error even with the use of a standard devices of which characteristic have not been verified by calculating the characteristic impedance of the correction device from the characteristics of an auxiliary measuring device calculated by using a general error correction method, and calculating again the once calculated characteristics of the auxiliary measuring device. The method in accordance with the present invention comprises the steps of modelling an auxiliary measuring device used for measuring a high frequency charateristics of the device under test by two transmission lines connected in series between two terminals and a parasitic component connected in parallel between a junction of the two transmission lines and a ground; and moving a reference measurement point to the junction of the two transmission lines by using a phase angle of each transmission line and calculating a reference impedance at the terminal of the auxiliary measuring device to which an object to be measured is connected by using the difference of the resultant reflection coefficients of each port.
REFERENCES:
patent: 3755732 (1973-08-01), Couper
Freshet, L., Accuracy consideration in RF network measurements, 1988, (abstract only).
Hwang Ingab
Kim Min Gun
Lee Chang Seok
Lee Jae Jin
Pyun Kwang Eui
Chung Phung M.
Electronics and Telecommunications Research Institute
LandOfFree
Method for correcting a high frequency measurement error does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for correcting a high frequency measurement error, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for correcting a high frequency measurement error will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1252427