Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrophotometer
Reexamination Certificate
2007-12-11
2007-12-11
Evans, F. L. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrophotometer
C356S300000, C702S085000, C702S104000
Reexamination Certificate
active
11093446
ABSTRACT:
Small, fast, and inexpensive in-line spectrophotometers can produce in-line spectrums of a substrate before or after printing on the substrate. In-line spectrums are generally far less complete than a reference spectrum produced with a large, slow, and expensive reference spectrophotometer. An in-line spectrum can be mapped to a reference spectrum using a variety of known algorithms. However, the mapping is erroneous when the media substrate type changes. Reference transform matrices and in-line transform matrices can correct the erroneous mapping.
REFERENCES:
patent: 6384918 (2002-05-01), Hubble, III et al.
patent: 6539323 (2003-03-01), Olson
patent: 2003/0050768 (2003-03-01), Mestha et al.
patent: 2003/0055575 (2003-03-01), Viassolo et al.
patent: 2003/0055611 (2003-03-01), Mestha et al.
Bartik Miroslav B.
Mestha Lalit K.
Evans F. L.
Kruker Richard H.
Lopez Kermit D.
Ortiz Luis M.
Xerox Corporation
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