Method for controlling one or more temperature dependent...

Optical waveguides – Miscellaneous

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C385S012000, C385S013000, C385S037000, C385S129000, C385S130000, C385S131000, C385S132000, C438S029000, C438S030000, C438S031000, C438S032000

Reexamination Certificate

active

10826502

ABSTRACT:
A method for controlling one or more temperature dependent optical properties of a structure in accordance with embodiments of the present invention includes heating at least a portion of a photonic band-gap structure and oxidizing the portion of the photonic band-gap structure during the heating to alter at least one temperature dependent optical property of the stack.

REFERENCES:
patent: 5651818 (1997-07-01), Milstein et al.
patent: 5682401 (1997-10-01), Joannopoulos et al.
patent: 5740287 (1998-04-01), Scalora et al.
patent: 6876683 (2005-04-01), Watanabe et al.
patent: 2002/0192680 (2002-12-01), Chan et al.
Buttard et al., “X-Ray-Diffraction Investigation of the Anodic Oxidation of Porous Silicon”,J. Appl. Phys. 79:8060-8070 (1996).
Buttard et al., “Porous Silicon Strain During in situ Ultrahigh Vacuum Thermal Annealing,”J. Appl. Phys. 85:7105-7111 (1999).
Yablonovitch et al., “Inhibited Spontaneous Emission in Solid-State Physics and Electronics,”Phys. Rev. Lett. 58:2059-2062 (1987).
Bai et al., “Strain in Porous Si Formed on a Si (100) Substrate,”Appl. Phys. Lett. 57:2247-2249 (1990).
Jellison et al., “The Temperature Dependence of the Refractive Index of Silicon at Elevated Temperatures at Several Laser Wavelengths,”J. Appl. Phys. 60:841-843 (1986).
Martinez, G.,in Handbook on Semiconductors Volume 2: Optical Properties of Solids, M. Balkanski, ed. North-Holland Publishing Company, New York, NY, pp. 181-222 (1980).
Lopez et al., “Erbium Emission from Porous Silicon One-Dimensional Photonic Band Gap Structures,”Appl. Phys. Lett. 77:3704-3706 (2000).
Sugiyama et al., “Microstructure and Lattice Distortion of Anodized Porous Silicon Layers,”J. Cryst. Growth103:156-163 (1990).
Kim et al., “Effective Method for Stress Reduction in Thick Porous Silicon Films,”Appl. Phys. Lett. 80:2287-2289 (2002).
Lugo et al., “Porous Silicon Multilayer Structures: A Photonic Band Gap Analysis,”J. Appl. Phys. 91:4966-4972 (2002).
Hirschman et al., “Silicon-Based Visible Light-Emitting Devices Integrated Into Microelectric Circuits,”Nature384:338-341 (1996).
Young et al., “X-Ray Double Crystal Diffraction Study of Porous Silicon,”Appl. Phys. Lett. 46:1133-1135 (1985).
Savage, N., “Linking with Light,”IEEE Spectrum39:32-36 (2002).
Painter et al., “Two-Dimensional Photonic Band-Gap Defect Mode Laser,”Science284:1819-1821 (1999).
Reece et al., “Optical Microactivities with Subnanometer Linewidths Based on Porous Silicon,”Appl. Phys. Lett. 81:4895-4897 (2002).
Lee et al., “Operation of Photonic Crystal Membrane Lasers Above Room Temperature,”Appl. Phys. Lett. 81:3311-3313 (2002).
John, S., “Strong Localization of Photons in Certain Disordered Dielectric Superlattices,”Phys. Rev. Lett. 58:2486-2489 (1987).
Weiss et al., “Electrically Tunable Silicon-Based Mirrors,”Proc. of SPIE4654:36-44 (2002).
Lin et al., “Demonstration of Highly Efficient Waveguiding in a Photonic Crystal Slab at the 1.5-μm Wavelength,”Opt. Lett. 25:1297-1299 (2000).
Theiβ, W., “Optical Properties of Porous Silicon,”Surf. Sci. Rep. 29:91-192 (1997).
Zhou et al., “The Effect of Thermal Processing on Multilayer Porous Silicon Microactivity,”Phys. Stat. Sol. A182:319-324 (2000).
Weiss et al., “Temperature Stability for Silicon-Based Photonic Band-Gap Structures,”Applied Physics Letters83:1980-1982 (2003).
DeLouise, Lisa, [http://www.futurehealth.rochester.edu/miller—group/people/lisa—delouise.html] Miller Research Group pp. 1-4 (2004).
S.M. Weiss, “Control of One-Dimensional Photonic Bandgap Thermal Tuning,”Phys. Stat. Sol. pp. 1-5 (Unpublished).
Grayson, M., ed.,Encyclopedia of Semiconductor Technology, John Wiley and Sons, New York , pp. 374 (1984).
Barla et al., “Determination of Lattice Parameter and Elastic Properties of Porous Silicon By X-Ray Diffraction,”Growth68:727-732 (1984).
Birner et al., “Silicon-Based Photonic Crystals,”Adv. Mater. 13:377-389 (2001).
Striemer et al., “Dynamic Etching of Silicon for Broadband Antireflection Applications,”Appl. Phys. Lett. 81:2980-2982 (2002).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for controlling one or more temperature dependent... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for controlling one or more temperature dependent..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for controlling one or more temperature dependent... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3800639

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.