Method for control of ground bounce above an internal ground pla

Details Method for control of ground bounce above an internal ground pla Method for control of ground bounce above an internal ground pla

1993-03-15

1995-02-14

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

364488, G01R 1073

Patent

active

053898745

ABSTRACT:
An algorithm selects probe locations for both test signal probes and ground probes in a short-wire board test fixture. The board test fixture connects a test system to a circuit board under test. The algorithm minimizes ground bounce. The algorithm envisions first superimposing an imaginary grid of squares over the circuit board. Then, ground probe locations are derived so that no more than five test signal probes for each ground probe reside within each of the imaginary squares and so that each critical test signal probe is associated within a preselected distance of a ground probe. In the preferred embodiment, the imaginary square measure 1.4 inches on a side, and the preselected distance is approximately one inch.

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