Method for contactless testing for electrical opens and short ci

Electricity: measuring and testing – Plural – automatically sequential tests

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324 96, 324501, 324158R, 356389, 364481, G01R 1512

Patent

active

048433292

ABSTRACT:
A method for contactlessly testing for opens and shorts in conducting paths within or on a nonconducting substrate. There are a plurality of conducting pads on the surface of the substrate. Charges are contactlessly generated, e.g., by an optical beam, in at least one selected pad inducing a voltage thereon and on pads electrically connected therewith through one of the conducting paths. A two dimensional electron flux is contactlessly caused to be emitted from the selected pad and at least one other pad of the plurality of pads, e.g., by an optical beam. The flux emitted from the pads depends on the voltage on each pad. The flux is detected to distinguish pads in electrical connection.

REFERENCES:
patent: 3436651 (1969-04-01), Helms et al.
patent: 4640002 (1987-02-01), Phillips et al.
patent: 4644264 (1987-02-01), Beha et al.
patent: 4670710 (1987-06-01), Beha et al.
patent: 4703260 (1987-10-01), Beha et al.
patent: 4736159 (1988-04-01), Shiragasawa et al.
Wiza, "Microchannel Plate Detectors", Nuclear Instruments and Methods, vol. 162, 1979, pp. 587-601.
IBM TDB., vol. 27, No. 10B, Mar. 1985, p. 5959, "Photoelectric Test Method for PCB Conductors".
IBM TDB, vol. 25, No. 3A, Aug. 1982, p. 1171, "Contactless Measurement of Voltage Levels Using Photoemission".
Review Sci. Instruments, vol. 49, No. 6, Jun. 1978, pp. 756-756, "Computer Controlled ESCA for Non-Destructive Surface Characterization Utilizing a TV-Type Position Sensitive Detector".
Nuclear Instruments and Methods in Physics Research, vol. 208, No. 1/3, Apr. 1983, pp. 373--377, "Project of a Photoelectron X-Ray Microscope on ACO Storage Ring".
Nuclear Instruments and Methods in Physics Research, vol. 208, No. 1/3, Apr. 1983, "A Display Type Analyzer With an Image Processing System for Angle-Resolved Photoelectron Spectroscopy", pp. 777-784.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for contactless testing for electrical opens and short ci does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for contactless testing for electrical opens and short ci, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for contactless testing for electrical opens and short ci will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-815986

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.