Method for computing crystal shapes from X-ray diffraction...

Details Method for computing crystal shapes from X-ray diffraction... Method for computing crystal shapes from X-ray diffraction...

2006-03-31

2010-06-15

Dunn, Drew A (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Dimensional determination

C702S001000, C702S022000, C378S070000, C378S073000

Reexamination Certificate

active

07739075

ABSTRACT:
The present invention relates to a method for computing external crystal shapes from X-Ray Diffraction Data (XRD) of a substance. Each diffraction peak arises from a set of crystal planes and the peak width is related to the thickness of the crystal in a direction perpendicular to these set of planes. The crystal shape is actually given by the mathematical envelope of the pairs of planes corresponding to each diffraction peak.

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