Electricity: measuring and testing – Plural – automatically sequential tests
Patent
1989-12-06
1991-03-19
Wieder, Kenneth
Electricity: measuring and testing
Plural, automatically sequential tests
324158R, 371 27, G01R 3128
Patent
active
050014188
ABSTRACT:
Disclosed is a method for compressing sequences of data-vectors, which sequences are to be used for testing circuit boards with the aid of a circuit board testing machine. The method involves an initial compression of the data-vector sequence followed by a so-called K-T transformation of the remaining data-vectors. The initial compression involves eliminating redundant data-vectors from the initial sequence and retaining only the unique data-vectors together with sequencing information indicating where in the initial sequence each unique-data vector occurred. The K-T transformation involves a bitwise logical exclusive-OR operation (XOR) whereby the remaining data-vector sequence is K-T transformed thereby further compressing the sequence without losing any of the original sequence information.
REFERENCES:
patent: 3584145 (1971-06-01), Cutler et al.
patent: 4254400 (1981-03-01), Yoda et al.
patent: 4426731 (1984-01-01), Edlund et al.
patent: 4439858 (1984-03-01), Petersen
patent: 4652814 (1987-03-01), Groves et al.
patent: 4698672 (1987-10-01), Chen et al.
Michael A. Lassner, Kevin W. Keirn, and Kenneth E. Posse, "Optimization of a Hardware Oriented Test Generation Language," ATE '87 West, Jan. 5-8, 1987, pp. VII-1-VII-15.
Trent Cave, "Compressing Test Patterns to Fit into LSI Testers," Electronics, Oct.-Dec., 1978, vol. 51, pp. 136-140.
Booth George L.
Keirn Kevin W.
Lassner Michael A.
Posse Kenneth E.
Byrne Christopher J.
Nguyen Vinh P.
Wieder Kenneth
LandOfFree
Method for compressing data-vectors for a circuit board testing does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for compressing data-vectors for a circuit board testing , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for compressing data-vectors for a circuit board testing will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2012646