Method for compensating for differences in capacitance...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

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C324S669000, C324S663000, C382S124000

Reexamination Certificate

active

08072230

ABSTRACT:
Disclosed is method for compensating for variation in the capacitance between multiple capacitive sensors. Prior to sensing operations, baseline capacitance values can be acquired for all sensors. A correction factor can be calculated based on such baseline values. During sensing operations (run-time), variations in capacitance from baseline values can be modified by appropriate correction factors. Sensitivity between sensors can thus be made more uniform.

REFERENCES:
patent: 4113378 (1978-09-01), Wirtz
patent: 4266144 (1981-05-01), Bristol
patent: 4305135 (1981-12-01), Dahl et al.
patent: 4831325 (1989-05-01), Watson, Jr.
patent: 5374787 (1994-12-01), Miller et al.
patent: 5495077 (1996-02-01), Miller et al.
patent: 5648642 (1997-07-01), Miller et al.
patent: 5730165 (1998-03-01), Philipp
patent: 5841078 (1998-11-01), Miller et al.
patent: 5854625 (1998-12-01), Frisch et al.
patent: 5861583 (1999-01-01), Schediwy et al.
patent: 5914465 (1999-06-01), Allen et al.
patent: 5920310 (1999-07-01), Faggin et al.
patent: 5942733 (1999-08-01), Allen et al.
patent: 6184871 (2001-02-01), Teres et al.
patent: 6188391 (2001-02-01), Seely et al.
patent: 6323846 (2001-11-01), Westerman et al.
patent: 6380931 (2002-04-01), Gillespie et al.
patent: 6414671 (2002-07-01), Gillespie et al.
patent: 6448911 (2002-09-01), Somayajula
patent: 6570557 (2003-05-01), Westerman et al.
patent: 6583632 (2003-06-01), Von Basse et al.
patent: 6610936 (2003-08-01), Gillespie et al.
patent: 6667740 (2003-12-01), Ely et al.
patent: 6677932 (2004-01-01), Westerman
patent: 6750852 (2004-06-01), Gillespie et al.
patent: 6781577 (2004-08-01), Shigetaka
patent: 6825673 (2004-11-01), Yamaoka
patent: 6888538 (2005-05-01), Ely et al.
patent: 6946853 (2005-09-01), Gifford et al.
patent: 7068039 (2006-06-01), Parker
patent: 7075316 (2006-07-01), Umeda et al.
patent: 7078916 (2006-07-01), Denison
patent: 7098675 (2006-08-01), Inaba et al.
patent: 7359816 (2008-04-01), Kumar et al.
patent: 7479788 (2009-01-01), Bolender et al.
patent: 7504833 (2009-03-01), Seguine
patent: 2003/0091220 (2003-05-01), Sato et al.
patent: 2003/0210809 (2003-11-01), Kim
patent: 2005/0031175 (2005-02-01), Hara et al.
patent: 2005/0275382 (2005-12-01), Stessman et al.
patent: 2006/0114247 (2006-06-01), Brown
patent: 2006/0197750 (2006-09-01), Kerr et al.
patent: 2006/0226922 (2006-10-01), Rajagopal et al.
USPTO Notice of Allowance for U.S. Appl. No. 11/395,417 dated Nov. 6, 2008; 7 pages.
USPTO Non-Final Rejection for U.S. Appl. No. 11/395,417 dated Apr. 25, 2008; 7 pages.
USPTO Non-Final Rejection for U.S. Appl. No. 11/395,417 dated Nov. 1, 2007; 8 pages.
USPTO Advisory Action for U.S. Appl. No. 11/395,417 dated Jul. 6, 2007; 3 pages.
USPTO Final Rejection for U.S. Appl. No. 11/395,417 dated Apr. 24, 2007; 9 pages.
USPTO Non-Final Rejection for U.S. Appl. No. 11/395,417 dated Oct. 26, 2006; 13 pages.
Dennis Seguine, “Capacitive Switch Scan,” Cypress Semiconductor Application Note, Apr. 14, 2005; 7 pages.
Mark Lee, “CapSense Best Practices,” Cypress Semiconductor Application Note, Oct. 19, 2006; 10 pages.
The Authoritative Dictionary of IEEE Standards Terms, 2000, IEEE Press Publications, 7th Edition, pp. 1133-1134; 4 pages.
USPTO Advisory Action for U.S. Appl. No. 11/512,042 dated Feb. 23, 2011; 3 pages.
USPTO Final Rejection for U.S. Appl. No. 11/512,042 dated Dec. 21, 2010; 7 pages.
USPTO Non-Final Rejection for U.S. Appl. No. 11/512,042 dated Jul. 13, 2010; 6 pages.
U.S. Appl. No. 12/618,661: “Automatic Tuning of a Capacitive Sensing Device,” Dana Olson, filed on Nov. 13, 2009; 30 pages.
U.S. Appl. No. 61/220,921: “Method for Automatically Tuning a Capacitive Sensing Device,” Dana Olson, filed on Jun. 26, 2009; 13 pages.

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