Electricity: measuring and testing – Of geophysical surface or subsurface in situ – Using electrode arrays – circuits – structure – or supports
Reexamination Certificate
2006-11-20
2008-10-07
Assouad, Patrick (Department: 2862)
Electricity: measuring and testing
Of geophysical surface or subsurface in situ
Using electrode arrays, circuits, structure, or supports
C324S367000
Reexamination Certificate
active
07432716
ABSTRACT:
A logging tool used in a borehole having non-conductive mud. The tool includes a known inductance in series with an electrode. The quality factor of a circuit that includes the electrode, the inductance and the earth formation is indicative of the resistivity of the formation. The quality factor may be determined using either a plurality of signals or by measuring a transient response.
REFERENCES:
patent: 2239466 (1941-04-01), Neufeld
patent: 2919396 (1959-12-01), McLaughlin et al.
patent: 2930969 (1960-03-01), Baker
patent: 3365658 (1968-01-01), Birdwell
patent: 3973181 (1976-08-01), Calvert
patent: 4122387 (1978-10-01), Ajam et al.
patent: 4468623 (1984-08-01), Gianzero et al.
patent: 4686477 (1987-08-01), Givens et al.
patent: 4899112 (1990-02-01), Clark et al.
patent: 4980642 (1990-12-01), Rodney
patent: 5442294 (1995-08-01), Rorden
patent: 5502686 (1996-03-01), Dory et al.
patent: 5543715 (1996-08-01), Singer et al.
patent: 5869968 (1999-02-01), Brooks et al.
patent: 5900733 (1999-05-01), Wu et al.
patent: 6351129 (2002-02-01), Gounot
patent: 6369575 (2002-04-01), Eisenmann et al.
patent: 6384605 (2002-05-01), Li
patent: 2004/0051531 (2004-03-01), Chemali et al.
patent: 2005/0006090 (2005-01-01), Chemali et al.
patent: 2005/0030034 (2005-02-01), Ganesan
patent: 2005/0134280 (2005-06-01), Bittar et al.
patent: 2006/0255811 (2006-11-01), Bittar et al.
patent: 2007/0007967 (2007-01-01), Itskovich et al.
patent: 2007/0030008 (2007-02-01), Cheung et al.
patent: 2007/0046290 (2007-03-01), Bespalov et al.
patent: 2007/0103162 (2007-05-01), Morys et al.
patent: 2007/0222453 (2007-09-01), Reiderman et al.
patent: 2007/0279063 (2007-12-01), Beard
patent: 685727 (1964-05-01), None
Se-Yuen Mak; The RLC circuit and the determination of inductance, Phys. Educ. 29 (1994), pp. 94-97.
Petersan et al.; Measurement of resonant frequency and quality factor of microwave resonators: Comparison of methods, Journal of Applied Physics, vol. 84, No. 6, Sep. 15, 1998, pp. 3392-3402.
Castillo Homero
Forgang Stanislav W.
Gold Randy
Itskovich Gregory B.
Assouad Patrick
Baker Hughes Incorporated
Madan Mossman & Sriram P.C.
Schindler David M.
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