Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system
Patent
1983-07-22
1987-03-17
Westin, Edward P.
Radiant energy
Photocells; circuits and apparatus
Optical or pre-photocell system
358212, 382 41, H01J 4014
Patent
active
046510141
DESCRIPTION:
BRIEF SUMMARY
INTRODUCTION
The present invention relates to a method for comparison between a first optical signal and at least one other signal.
The predominant technique today for processing optical information in the form of images is to process the content of the image point by point. One often uses an image sensor of the charge transfer device type, from which the image information is fed out point by point and stored in a memory. The content of this memory is then processed bit by bit against information stored in an operator memory. In this way operations of the type correlation, derivation etc in order to recognize images or different kinds of transformations of matrices for bandwidth-limitation of the content of the images is performed. As this method means a serial processing of a very large amount of information the image processing becomes time consuming and it demands a very high computer capacity.
During the last years there has been a great international activity to create methods performing parallel processing of the content of an image. This means that all image points are processed simultaneously, which gives tremendous benefits in the calculation time. The use of Fourier-transformation is a possibility due to the nature of coherent light. Such methods demand a very high mechanical stability in the optical system that is used for processing the image.
The invention that will be described here, has at least four advantages compared with previous solutions for processing images: combination of these. The operative signals can either be addressed to discrete image points or operate parallelly over the image or parts of it.
The mentioned advantages are achieved by the invention that is evident from the following description.
BRIEF DESCRIPTION OF THE DRAWINGS
In the following, the invention will be further described with reference to the attached drawings, in which
FIG. 1 shows a cross-section of the MIS-structure (metal insulator semiconductor structure);
FIG. 2 shows the energy band model for a structure according to FIG. 1 illuminated by chopped light;
FIG. 3 shows the structure in FIGS. 1 and 2 connected to a measuring instrument;
FIG. 4 shows an oscilloscope picture from a device according to FIGS. 1-3;
FIG. 5 shows the structure illuminated both with chopped light and constant light;
FIG. 6 shows experimental data of the electric signal U as a function of an applied outer potential V.sub.o during illumination with a chopped light source with the intensity .PHI..sub.1 ;
FIG. 7 shows experimental data of how the electric signal U from the MIS-structure can be controlled by another light source with constant intensity .PHI..sub.2 ;
FIG. 8 shows experimental data of the electric signal U as a function of the chopped light source with the intensity .PHI..sub.1, with the intensity .PHI..sub.2 from the constant light source as a parameter;
FIG. 9 shows a slice, in the form of a MIS-structure according to FIG. 1 seen from the side on which the conductor 3 is applied, illuminated in one point by chopped light with the intensity .PHI..sub.1 and in another point by constant light with the intensity .PHI..sub.2 ;
FIG. 10 shows the electric signal U as a function of the displacement of the light spot with the intensity .PHI..sub.2 in FIG. 9;
FIG. 11 shows how different image points in an opto-electric processor can be addressed;
FIG. 12 shows how an image point in a colour sensitive optical processor can be designed.
DETAILED DESCRIPTION
The device comprises (FIG. 1) a MIS-structure (Metal Insulator Semiconductor Structure) consisting of a semiconductor 1 with a thin insulator layer 2, on which a thin electrically conducting layer 3 is applied. Metal contact 7 is on the back side of the structure. The energy band model for such a structure is shown in FIG. 2. The component in FIG. 2 is illuminated by chopped light from a chopper 10 and it is connected to an electric measuring instrument 4 in order to measure the current or the voltage as is shown in FIG. 3. The MIS-structure is indicated with 11. In the exa
REFERENCES:
patent: 3894295 (1975-07-01), Shannon et al.
patent: 3916268 (1975-10-01), Engeler
patent: 4334239 (1982-06-01), Herbst
patent: 4539591 (1985-09-01), Zermeno
Forsvarets Forskningsanstait
Oen William L.
Westin Edward P.
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