Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent
1989-11-08
1991-10-01
Wieder, Kenneth
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
324601, 324606, 324647, 333 81A, G01R 2728, G01N 2200
Patent
active
050537121
ABSTRACT:
A method for comparing the quality of RF absorbers uses a TEM cell which is provided with a low-reflection termination, in which cell the absorber wall (5) is equipped with reference absorbers (13). A steep-edged pulse wave is radiated in by means of a pulse generator (9) and a scattered wave reflected by the test absorber (14) is detected by means of a sensor (10). A reflection of the absorber wall is then determined by means of a first calibration measurement. The reference absorber is removed in a test area and a reflection of a metal wall (8) lying behind it is then determined by means of a second calibration measurement. Finally, a reflection of the test absorber (14) arranged in the test area is determined in a comparison measurement.
REFERENCES:
patent: 2594971 (1952-04-01), Moullin
patent: 3778837 (1973-12-01), Hardy
patent: 4003840 (1977-01-01), Ishino et al.
patent: 4281284 (1981-07-01), Stutz et al.
Emerson et al., "Broadband Absorbing Materials", Tel-Tech & Electronic Industries, (Nov. 1955) pp. 74-75.
Newman, "Radiation Absorbers-Their Selection and Use", Electronic Design (Feb. 1957).
Meyer, "Experiments on CM Waves in Analogy with Acoustic Techniques Made in Gottingen", Journal of the Acoustical Society of America, vol. 30, No. 7 (Jul. 1958) pp. 624-632.
Die Kurzinformation 14, 12/1965, p. 19, Neues von Rohde & Schwarz, "Reflexion Absorbierender Flachen Im Freien Raum".
Mikrowellen Magazine, vol. 13, No. 6, 12/1987, pp. 701-703, H. Seemann, et al., "Firmenportrait".
Electronics Letters, vol. 23, No. 5, Feb. 26, 1987, pp. 184-185, A. Kumar, "Acetylene Black: A Single-Layer Microwave Absorber".
IEEE Transactions on Electromagnetic Compatibility, vol. EMC-24, No. 3, Aug. 1982, pp. 356-358, R. G. Fitz Gerrell, "Using Free-Space Transmission Loss for Evaluating Anechoic Chamber Performance".
Electronics and Communications in Japan, vol. 62-B, No. 5, 12/1979, pp. 67-75, M. Ono, et al., "Measurement of Oblique-Incidence Characteristics of Absorbers by Standing Wave Technique".
IEEE 1988 International Symposium on EMC, Seattle, U.S.A., Aug. 2-4, 12/1988, pp. 1-7, D. Hansen, et al., "An Investigation into the Scattering and Radiation Characteristic of RF-Absorbers".
Asea Brown Boveri Ltd.
Mueller Robert W.
Wieder Kenneth
LandOfFree
Method for comparing the quality of RF absorbers does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for comparing the quality of RF absorbers, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for comparing the quality of RF absorbers will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1757659