Coating processes – Measuring – testing – or indicating
Patent
1997-05-14
2000-12-19
Beck, Shrive
Coating processes
Measuring, testing, or indicating
427 9, 4272481, C23C 1652
Patent
active
061624888
ABSTRACT:
The present invention is directed to a method of controlling the application of a surface coating by chemical deposition using a closed loop control on growth rate. The method compares a measure of growth rate against a setpoint for the growth rate and adjusts a primary input parameter in order to drive/maintain the measure of growth rate equal to the setpoint.
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Gevelber Michael A.
Toledo-Quinones Manuel
Beck Shrive
Boston University
Chen Bret
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