Method for cleaning semiconductor equipment

Cleaning and liquid contact with solids – Processes – Including application of electrical radiant or wave energy...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C134S022100, C166S067000, C438S905000

Reexamination Certificate

active

07931752

ABSTRACT:
A method for cleaning a semiconductor equipment is provided. First, a first cleaning step is performed to the process chamber. The first cleaning step includes conducting a cleaning gas into the process chamber via a short processing gas injector for generating a plasma of the cleaning gas in the process chamber. Then, a cleaning step is performed to a long cleaning gas injector. The cleaning step performed to the long cleaning gas injector includes conducting the cleaning gas into the process chamber via the long processing gas injector. Then, a second cleaning step is performed to the process chamber. The second cleaning step includes conducting the plasma of the cleaning gas into the process chamber via the short processing gas injector.

REFERENCES:
patent: 6200412 (2001-03-01), Kilgore et al.
patent: 7055212 (2006-06-01), Blanco-Rivera et al.
patent: 2002/0195124 (2002-12-01), Chin et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for cleaning semiconductor equipment does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for cleaning semiconductor equipment, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for cleaning semiconductor equipment will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2636095

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.