Method for cleaning reactors used for gas-phase processing of wo

Cleaning and liquid contact with solids – Processes – Hollow work – internal surface treatment

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134 37, 29 2501, B08B 9093

Patent

active

051640171

ABSTRACT:
A method for cleaning reactors for the gas-phase processing of workpieces, particularly in the field of semiconductor technology and more particularly in the field of coating semiconductor substrates by means of chemical deposition processes, with less effort entails providing the reactor with a gas permeable inner wall within the usual gas impermeable outer wall, the inner wall surrounding a chamber for coating a workpiece by means of a chemical deposition process, plenums being formed between the inner and outer walls, and further with conduit means communicating between the exterior of the reactor and the plenums and conduit means communicating between the exterior of the reactor and the inner chamber, and effecting a cleaning cycle in which an etching gas is conducted through the inner chamber by being introduced into the reactor through one of the aforementioned conduit means and withdrawn from the reactor through another of the aforementioned conduit means.

REFERENCES:
patent: 4828224 (1989-05-01), Crabb et al.
patent: 4842683 (1989-06-01), Cheng et al.
patent: 4874464 (1989-10-01), Goodwin et al.

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