Method for classifying memory cells in an integrated circuit

Details Method for classifying memory cells in an integrated circuit Method for classifying memory cells in an integrated circuit

2011-01-04

2011-01-04

Luu, Pho M (Department: 2824)

Static information storage and retrieval

Floating gate

Particular biasing

C365S210120, C365S230060, C365S230080

Reexamination Certificate

active

07864593

ABSTRACT:
A method for classifying memory cells in an integrated circuit is provided, wherein the integrated circuit has a memory cell field including a plurality of memory cells. The method includes determining, for each subset of the memory cells of a plurality of subsets of the memory cells, a threshold voltage distribution; determining whether the determined threshold voltage distributions fulfill a threshold voltage criterion; and depending on whether the determined threshold voltage distributions fulfill the threshold voltage criterion, classifying at least some of the non-selected memory cells.

REFERENCES:
patent: 4758989 (1988-07-01), Davis et al.
patent: 5278785 (1994-01-01), Hazani
patent: 6166957 (2000-12-01), Chung et al.
patent: 6343045 (2002-01-01), Shau
patent: 6826074 (2004-11-01), Yamauchi
patent: 6862236 (2005-03-01), Maruyama
patent: 2006/0126382 (2006-06-01), Maayan et al.
patent: 2007/0030741 (2007-02-01), Nii et al.
patent: 2007/0211537 (2007-09-01), Park et al.

Affiliated with

Also associated with

Rating

Method for classifying memory cells in an integrated circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for classifying memory cells in an integrated circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for classifying memory cells in an integrated circuit will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2656630