Method for classifying a substrate

Details Method for classifying a substrate Method for classifying a substrate

2005-04-19

2005-04-19

Von Buhr, Maria N. (Department: 2125)

Data processing: generic control systems or specific application

Specific application, apparatus or process

Product assembly or manufacturing

C700S110000, C438S014000, C702S082000

Reexamination Certificate

active

06882896

ABSTRACT:
A method for classifying a substrate first provides the substrate and its corresponding inspection map. Then, a database having a plurality of specification data is provided. After that, the inspection map is compared with each of the specification data so as to find the specification data coinciding with the inspection map. Finally, the substrate is defined according to the layout of active areas coinciding with the inspection map, and then the substrate is classified and stored.

REFERENCES:
patent: 6011619 (2000-01-01), Steffan et al.
patent: 6096093 (2000-08-01), Caywood et al.
patent: 6272393 (2001-08-01), Steffan et al.
patent: 6466895 (2002-10-01), Harvey et al.
patent: 6674889 (2004-01-01), Takayama
patent: 6792366 (2004-09-01), Hosoya et al.
patent: 6792367 (2004-09-01), Hosoya et al.
patent: 2001-067479 (2001-03-01), None

Affiliated with

Also associated with

Rating

Method for classifying a substrate does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for classifying a substrate, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for classifying a substrate will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3416672