Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1994-03-09
1996-01-09
Karlsen, Ernest F.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
3241581, 437 8, G01R 3128, H01L 2166
Patent
active
054831750
ABSTRACT:
Integrated circuit devices on a wafer are tested by the use of test circuit on the integrated circuit devices which is connected by means of a grid. The grid is used to enable the test circuitry, and provides an ability to test the devices while still on the wafer. This facilitates burning in the wafer prior to singulating the parts, since it is not necessary to separately establish electrical connections at contact points on the individual integrated circuit devices. In one embodiment, an oscillator may be adjusted in speed so that further tests may be effected by changing a test speed through the test circuit. Response of the integrated circuits at different operating speeds is determined by the adjustment of the oscillator speed so that a timing signal used for the testing may be varied.
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Ahmad Aftab
Green Robert S.
Weber Larren G.
Gratton Stephen A.
Karlsen Ernest F.
Micro)n Technology, Inc.
Protigal Stanley N.
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