Method for circuit inspection

Details Method for circuit inspection Method for circuit inspection

2007-01-16

2007-01-16

Benson, Walter (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S1540PB

Reexamination Certificate

active

11402900

ABSTRACT:
A method for inspecting an electronic circuit formed on a board with a peripheral circuit includes steps of providing a terminal for inputting and outputting an electronic signal, providing an impedance increase means for increasing an impedance of an electrical connection between the electronic circuit and the peripheral circuit and providing an inspection means for inspecting the electronic circuit. The impedance of the electronic circuit is increased to prevent influence of the peripheral circuit before and during inspection of the electronic circuit, and the increase of the impedance is removed after the inspection.

REFERENCES:
patent: 5659257 (1997-08-01), Lu et al.
patent: 5721495 (1998-02-01), Jennion et al.
patent: 5901096 (1999-05-01), Inokuchi et al.
patent: 6801050 (2004-10-01), Takechi et al.
patent: A-5-72280 (1993-03-01), None
patent: A-11-258307 (1999-09-01), None
patent: A-2002-40113 (2002-02-01), None

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