Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-06-14
2005-06-14
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
06906540
ABSTRACT:
A method of fabricating a plurality of micro probes comprising the steps of defining the shapes of a plurality of probes as a mask, applying a photoresist to a surface of a metal foil, overlaying the mask on the metal foil, exposing the photoresist to light passed through the mask, developing the photoresist, removing a portion of the photoresist to expose a portion of the metal foil, applying an etcher to the surface of the metal foil to remove the exposed portion to produce a plurality of probes, and chemically polishing and plating the plurality of probes.
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Translation of Official Japanese Office Action, Mailing No. 228197, Mailed on Jun. 25, 2004 for Japanese Patent Application No. 2002-273131.
Barto Charles L.
McQuade Francis T.
Gangemi Anthony P.
Hollington Jermele
Nguyen Vinh
Rosenblatt Gregory S.
Wentworth Laboratories Inc.
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