Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate
2008-09-09
2008-09-09
Dang, Phuc T (Department: 2892)
Semiconductor device manufacturing: process
With measuring or testing
C438S010000, C438S011000, C374S161000, C374S162000
Reexamination Certificate
active
10852007
ABSTRACT:
A method for connecting terminals is provided. The method includes steps of a) providing a board having a first terminal thereon; b) performing a check of a heat treatment by using a thermal sensitive paper in order to determine a optimal condition of the heat treatment for the board; c) heating the first terminal under the optimal condition of the heat treatment; and d) connecting a second terminal to the heated first terminal.
REFERENCES:
patent: 5494179 (1996-02-01), Hori et al.
patent: 2004/0251527 (2004-12-01), Van Puymbroeck et al.
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