Radiant energy – With charged particle beam deflection or focussing – With target means
Reexamination Certificate
2007-02-13
2007-02-13
Vanore, David A. (Department: 2881)
Radiant energy
With charged particle beam deflection or focussing
With target means
C250S3960ML
Reexamination Certificate
active
10942184
ABSTRACT:
A surface of an insulating substrate is charged to a target potential. In one embodiment, the surface is flooded with a higher-energy electron beam such that the electron yield is greater than one. Subsequently, the surface is flooded with a lower-energy electron beam such that the electron yield is less than one. In another embodiment, the substrate is provided with the surface in a state at an approximate initial potential above the target potential. The surface is then flooded with charged particle such that the charge yield of scattered particles is less than one, such that a steady state is reached at which the target potential is achieved. Another embodiment pertains to an apparatus for charging a surface of an insulating is substrate to a target potential.
REFERENCES:
patent: 3458752 (1969-07-01), Stowell
patent: 4415851 (1983-11-01), Langner et al.
patent: 5045705 (1991-09-01), Mollenstedt
patent: 5432345 (1995-07-01), Kelly
patent: 5973323 (1999-10-01), Adler et al.
patent: 5986263 (1999-11-01), Hiroi et al.
patent: 5990476 (1999-11-01), Larson et al.
patent: 6066849 (2000-05-01), Masnaghetti et al.
patent: 6734429 (2004-05-01), Takagi
patent: 6930309 (2005-08-01), Mankos et al.
Bertsche Kirk J.
McCord Mark A.
KLA-Tencor Technologies Corporation
Okamoto & Benedicto LLP
Vanore David A.
LandOfFree
Method for charging substrate to a potential does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for charging substrate to a potential, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for charging substrate to a potential will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3867692