Method for characterizing x-ray detector materials using a...

Details Method for characterizing x-ray detector materials using a... Method for characterizing x-ray detector materials using a...

2011-03-15

2011-03-15

Lauchman, L. G (Department: 2877)

Optics: measuring and testing

By dispersed light spectroscopy

With raman type light scattering

C356S326000

Reexamination Certificate

active

07907274

ABSTRACT:
An improved Raman microspectrometer system extends the optical reach and analysis range of an existing Raman microspectrometer to allow analysis and/or repair of an oversized sample. The improved Raman microspectrometer system includes an extender for extending the optical reach of the existing microspectrometer and a supplemental stage which extends the analysis range of the existing microspectrometer by providing travel capabilities for non-destructive analysis of an entire oversized sample. Such an arrangement decreases manufacturing costs associated with testing oversized samples such as mammography panels, enabling analysis and/or repair to be performed without destruction.

REFERENCES:
patent: 6067154 (2000-05-01), Hossain et al.
patent: 6337472 (2002-01-01), Garner et al.
patent: 6744500 (2004-06-01), Bradbury et al.
patent: 7034930 (2006-04-01), Subramanian et al.

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