Method for characterizing a read head based on write induced mag

Electricity: measuring and testing – Magnetic – Magnetic information storage element testing

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360 31, 369 53, 369 55, G01R 3312, G11B 2736, G11B 509, G04C 1304

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060257121

ABSTRACT:
The present invention relates to a method for characterizing a head in a hard drive assembly, in which the head has a write element. The method comprises providing a disk attached to a hard disk drive assembly, the disk having a plurality of tracks each having a track centerline. One of the tracks has a plurality of sectors. One of the sectors has a servo field with an A burst, a B burst and a C burst, where the A burst and the C bursts have a common boundary located at a track centerline and where the B burst has a center that is positioned along the track centerline. Each sector also has a data field. The read element is aligned with the B servo burst, and data is written in a data field of a first sector of one of the tracks. An A burst and a C burst located in a following sector of one of the tracks is read to provide an A burst amplitude value and a C burst amplitude value. A characteristic of the read element based on the A burst amplitude value and the C burst amplitude value is then determined.

REFERENCES:
patent: 5914594 (1999-06-01), Mian
"Determining a Signal to Noise Ration for an Arbitrary Data Sequence by a Time Domain Analysis," by Guo Mian and Thomas D. Howell, Feb. 15, 1993, 3 pages.
"Micromagnetic transverse correlation length in thin film magnetic recording media, medium noise, and tracking," by Muo Mian, Ronald S. Indeck, Marcel W. Muller, Journal of Magnetic and Magnetic Materials 152(1996), revised Jun. 26, 1995, pp. 253-264.
"Effects of a Highly Permeable Keeper layer on Transition Shifts for Thin Film Media," by Guo Mian, Po-Kang Wang, IEEE Transactions on Magnetics, vol. 30, No. 6, Nov. 1994, pp. 3984-3986.
"Read Write Analyzer/Wite.TM. Windows .TM. Integrated Test Environment--User's Guide," Guzik Technical Enterprises, pp. iii, 87-89.
"Write Induced Track Misregistration Due to Magnetic Center Shifts In Thin Film Inductive Heads," by Michael P. Salo et al., IEEE Transactions on Magnetics, vol. 30, No. 6, Nov. 1994, pp. 3882-3884.
"An Algorithm for a Real Time Measurement of Nonlinear Transition Shift by a Time Domain Correlation Analysis," by Guo Mian, IEEE Transactions on Magnetic, vol. 31, No. 1, Jan. 1995.

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