Optics: measuring and testing – Angle measuring or angular axial alignment
Reexamination Certificate
2007-02-06
2007-02-06
Stafira, Michael P. (Department: 2877)
Optics: measuring and testing
Angle measuring or angular axial alignment
Reexamination Certificate
active
10743840
ABSTRACT:
A method for calibrating and aligning a metrology system comprising a machine including multi-axis part-positioning means and a wavefront-measuring gauge embedded in the machine. The gauge is used in determining spatial relationships among the translational and rotational axes, between part surface coordinates and machine coordinates, and between machine coordinates embedded gauge coordinates; in calibrating various components of the machine and the embedded gauge; and in aligning itself to the machine. A complete method comprises the steps of coarsely aligning the machine rotary axes with their respective translational axes and setting nominal zero points for the rotary axes; aligning the embedded gauge mainframe to the machine axes; aligning the embedded gauge focal point onto a spindle axis; determining the spatial offsets between the rotary axes when so aligned; precisely aligning the machine rotary axes with their respective translational axes; and setting precise zero points for the rotary axes.
REFERENCES:
patent: 3826011 (1974-07-01), D'Aniello
patent: 4840490 (1989-06-01), Gabriel et al.
patent: 5926781 (1999-07-01), Scott
patent: 6401349 (2002-06-01), Onyon
Fleig Jon
Forbes Greg
Murphy Paul
Brown Robert C.
QED Technologies International, Inc.
Slifkin Neal L.
Stafira Michael P.
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