Measuring and testing – Instrument proving or calibrating – Timing apparatus
Reexamination Certificate
2006-10-17
2006-10-17
Noland, Thomas P. (Department: 2856)
Measuring and testing
Instrument proving or calibrating
Timing apparatus
Reexamination Certificate
active
07121132
ABSTRACT:
A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase of either a clock signal or a strobe signal is adjusted with reference to the phase of the other signal. The relative phase difference between clock signals or between strobe signals are determined. The phases of the clock and strobe signals are adjusted with reference to the relative phase difference.
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Advantest Corporation
Dellett & Walters
Noland Thomas P.
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