Method for calibrating semiconductor test instrument

Details Method for calibrating semiconductor test instrument Method for calibrating semiconductor test instrument

2006-05-16

2006-05-16

Noland, Thomas P. (Department: 2856)

Measuring and testing

Instrument proving or calibrating

Timing apparatus

C324S762010

Reexamination Certificate

active

07043959

ABSTRACT:
A method for calibrating a semiconductor test instrument leading cost reduction, simplified work, and short working time. Drivers are related to comparators in one-to-one correspondence. A clock signal and a strobe signal have a one-to-one correspondence. The phase of either a clock signal or a strobe signal is adjusted with reference to the phase of the other signal. The relative phase difference between clock signals or between strobe signals are determined. The phases of the clock and strobe signals are adjusted with reference to the relative phase difference.

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