Method for calibrating semiconductor devices using a common...

Details Method for calibrating semiconductor devices using a common... Method for calibrating semiconductor devices using a common...

2005-10-25

2005-10-25

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Calibration

C324S1540PB

Reexamination Certificate

active

06958613

ABSTRACT:
Interface parameters for a plurality of semiconductor devices, particularly parameters for output drivers (i.e. on chip driver) and terminations (i.e. on die termination) for double data rate dynamic random access memories, are aligned using a calibration reference which is common to the semiconductor devices and is connected to calibration connections on the semiconductor devices. The semiconductor devices are calibrated in succession, in each case individually, and the calibration connection on the respective semiconductor device which is currently performing calibration is connected to an internal calibration unit by an internal switching unit in the process, and the calibration connections on all other semiconductor devices are terminated to a high impedance internally.

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patent: 100 37 477 (2002-02-01), None

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