Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Reexamination Certificate
2006-04-11
2006-04-11
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
C324S601000, C702S085000
Reexamination Certificate
active
07026829
ABSTRACT:
The accuracy of a method for calibrating an N terminal microwave measurement network (10), the method comprising the measurement of network parameter values of a load device (43), depends on the knowledge of the parasitic impedance of the load device (43). According to the invention, the accuracy of the method is improved by at least approximately determining the parasitic impedances of the load device (43). In one embodiment this is achieved by measuring network parameter values of an auxiliary open device (44), having a substantially identical parasitic impedance as the load device (43). The accuracy is further increased by measuring network parameter values of an auxiliary short device (45), having a substantially identical parasitic impedance as the load device (43). A similar principle can be used for de-embedding a device under test. A load device (43), an auxiliary open device (44) and an auxiliary short device (45) having substantially identical parasitic impedances are disclosed.
REFERENCES:
patent: 6249128 (2001-06-01), Begg
patent: 6643597 (2003-11-01), Dunsmore
patent: 6744262 (2004-06-01), Adamian
patent: 6832170 (2004-12-01), Martens
patent: 6895343 (2005-05-01), Jacobsen et al.
patent: 2004/0051538 (2004-03-01), Adamian
patent: 2004/0201383 (2004-10-01), Anderson
Deb Anjan
Koninklijke Philips Electronics , N.V.
Nguyen Hoai-An D.
Zawilski Peter
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