Method for calibrating a pick and place machine using a glass pa

Measuring and testing – Testing of apparatus

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Details

73 179, 33502, 356401, G01B 1127

Patent

active

060501510

ABSTRACT:
A method for calibrating a pick and place machine including picking a calibrated chip having a first calibration mark from a parts pick up jig with a placing head of the pick and place machine, placing the calibrated chip on a calibrated plate having a second calibration mark with the pick and place machine placing head, the calibrated plate being located on a pick and place machine assembly table and comparing the relative alignment of the first calibration mark and the second calibration mark.

REFERENCES:
patent: 4776088 (1988-10-01), Biggs et al.
patent: 5237622 (1993-08-01), Howell
patent: 5247844 (1993-09-01), Howell
patent: 5537204 (1996-07-01), Woodhouse

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