Measuring and testing – Testing of apparatus
Patent
1998-01-20
2000-04-18
Noland, Thomas P.
Measuring and testing
Testing of apparatus
73 179, 33502, 356401, G01B 1127
Patent
active
060501510
ABSTRACT:
A method for calibrating a pick and place machine including picking a calibrated chip having a first calibration mark from a parts pick up jig with a placing head of the pick and place machine, placing the calibrated chip on a calibrated plate having a second calibration mark with the pick and place machine placing head, the calibrated plate being located on a pick and place machine assembly table and comparing the relative alignment of the first calibration mark and the second calibration mark.
REFERENCES:
patent: 4776088 (1988-10-01), Biggs et al.
patent: 5237622 (1993-08-01), Howell
patent: 5247844 (1993-09-01), Howell
patent: 5537204 (1996-07-01), Woodhouse
Korfanta Craig M.
MCMS Inc.
Noland Thomas P.
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