Thermal measuring and testing – Thermal calibration system
Patent
1987-10-19
1989-03-14
Yasich, Daniel M.
Thermal measuring and testing
Thermal calibration system
2502521, 374 29, 374144, G01D 1800, G01K 1500
Patent
active
048120502
ABSTRACT:
Double-sided, high-frequency response heat flux gauge for use on metal tune blading consists of a metal film (1500A) resistance thermometer sputtered on both sides of a thin (25 .mu.m) polyimide sheet. The temperature difference across the polyimide is a direct measure of the heat flux at low frequencies, while a quasi-one-dimensional analysis is used to infer the high-frequency heat flux from the upper surface history. A new method of calibrating the heat flux gauge utilizes light source applied to a plurality of fluids covering the surface of the gauge, measuring the temporal output of the gauge and utilizing derived calibration formula.
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Epstein Alan H.
Guenette Gerald R.
Norton Robert J. G.
Lall Prithvi C.
McGill Arthur A.
McGowan Michael J.
The United States of America as represented by the Secretary of
Yasich Daniel M.
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