Method for calibrating a coordinate measuring apparatus having t

Details Method for calibrating a coordinate measuring apparatus having t Method for calibrating a coordinate measuring apparatus having t

1995-09-25

1997-07-22

Bennett, G. Bradley

Geometrical instruments

Gauge

With calibration device or gauge for nuclear reactor element

33567, G01B 100

Patent

active

056493681

ABSTRACT:
The invention is directed to a method for calibrating a coordinate measuring apparatus which has a probe 10. The probe 10 is movably guided in a plane (x, y) via two parallel pivot axes (6, 8) which are arranged one behind the other. For calibrating the primary dimensions (R1, R2, .phi.0, .psi.0, dT) of the coordinate measuring apparatus, contours or geometric elements are contact scanned on a calibration body with the probe. The contours or geometric elements are so selected that the diameter dT of the probe ball 12 attached to the probe enters into the measuring result for the geometric elements or their spacing with different weight or sign. Thereafter, the primary dimensions (R1, R2, .phi.0, .psi.0, dT) are determined from the measured values obtained by contact scanning the contours for the position of the probe 10 in the plane (x, y) and from the known dimensions of the geometric elements.

REFERENCES:
patent: 4819195 (1989-04-01), Bell et al.
patent: 4884348 (1989-12-01), Zeller et al.
patent: 4884889 (1989-12-01), Beckwith, Jr.
patent: 4891889 (1990-01-01), Tomelleri
patent: 4962591 (1990-10-01), Zeller et al.
patent: 5396712 (1995-03-01), Herzog
"QUIKCHEK " Masters for CMM advertisement (Glastonbury Gage Company) Sep. 1990.

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