Method for calculating tolerable value for fluctuation in...

Details Method for calculating tolerable value for fluctuation in... Method for calculating tolerable value for fluctuation in...

2006-09-20

2009-12-08

West, Jeffrey R (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C327S065000, C716S030000

Reexamination Certificate

active

07630845

ABSTRACT:
A method for calculating a tolerable value for simultaneous switching noise in an input/output circuit having a differential input supplied with a power supply voltage. The method includes providing an input/output circuit having a differential input unit with a pulse signal of a predetermined duty ratio, setting a tolerable range for the duty ratio of the output signal of the input/output circuit with respect to the pulse signal, changing the power supply voltage supplied to the differential input unit of the input/output circuit, measuring the duty ratio of the output signal corresponding to the voltage change, comparing the measured duty ratio with the tolerable range, and calculating a tolerable value for the simultaneous switching noise.

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patent: 2005-038400 (2005-02-01), None
R. Senthinathan et al.; “Simultaneous Switching Noise of CMOS Devices and Systems”; Kluwer Academic Publishers, 1994; (pp. 23-28).

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