Method for calculating adaptive inference test figure of merit

Details Method for calculating adaptive inference test figure of merit Method for calculating adaptive inference test figure of merit

1989-11-07

1991-08-27

Dixon, Joseph L.

Excavating

364580, 364513, 371 221, G01R 3128, G05B 1902

Patent

active

050439871

ABSTRACT:
A method for using an adaptive inference system to detect and locate faults in an electrical or electronic device or assembly. The steps include performing a position-dependent, time-ordered test upon an electrical or electronic device or assembly to provide comprehensive error analysis. The error analysis includes a library of error information. Previously unobserved faults can be detected and located despite their possible remoteness within the device or assembly. When detected faults are compared with error library, a figure of merit is calculated for all possibilities of detected faults.

REFERENCES:
patent: 4402054 (1983-08-01), Osborne et al.
patent: 4642782 (1987-02-01), Kemper et al.
patent: 4688234 (1987-08-01), Robinton
patent: 4709366 (1987-11-01), Scott et al.
patent: 4766595 (1988-08-01), Gollomp
patent: 4791578 (1988-12-01), Fazio et al.
patent: 4803642 (1989-02-01), Murananga
patent: 4841456 (1989-06-01), Hogan, Jr. et al.
patent: 4847795 (1989-07-01), Baker et al.

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