Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1998-02-19
2000-08-29
Metjahic, Safet
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324761, 324762, G01R 3102
Patent
active
061114189
ABSTRACT:
In the contact probe 1 having an array of leads 3 densely attached to a surface of an insulative film 2, pressure contact ends are formed by one end of the leads 3 being arranged in an array along one end edge portion of the insulative film 3. Slots are formed in the one end edge portion of the insulative film 2 such that the slots 9 are open between adjacent contact ends. When the lead ends arranged in the array on the surface of the insulative film are contacted under pressure with a given electronic part, a sufficient degree of freedom of flexure of the contact ends is obtained, so that the contact ends are contacted under pressure with the external terminals of the electronic part.
REFERENCES:
patent: 5061894 (1991-10-01), Ikeda
patent: 5211895 (1993-05-01), Janko et al.
patent: 5221895 (1993-06-01), Janko et al.
patent: 5521518 (1996-05-01), Higgins
patent: 5621333 (1997-04-01), Long et al.
Katakawa Hiroshi
Kobashi Narutoshi
Okamoto Ken-ichi
Okuno Toshio
Metjahic Safet
Soshotech Co., Ltd.
Sundaram T. R.
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